Patent · US Active

Test bench, method, and computer program product for performing a test case on an integrated circuit

US8140315B2 · kind B2 · utility

4Cited by

4References

20Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Joerg Walter · Lörrach, DE
Lothar Felten · Hauset, BE
Christopher Smith · Rochester, US
Ulrike Schmidt · Eppelheim, DE

Key dates

Filing date	Oct 8, 2008
Grant date	Mar 20, 2012
Priority date	—
Expiry date	Aug 6, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/261
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure relates to a test bench, method, and computer program product for performing a test case on an integrated circuit. The test bench may comprise a simulation environment representing an environment for implementing the integrated circuit and a reference model of the integrated circuit, wherein the reference model may be prepared for running within the simulation environment. The test bench may further comprise a device for running a simulation on the reference model within the simulation environment. The reference model may be based on an original reference model provided for a formal verification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.