Dynamically estimating lifetime of a semiconductor device
US8151094B2 · kind B2 · utility
18Cited by
10References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2005 |
| Grant date | Apr 3, 2012 |
| Priority date | — |
| Expiry date | Jun 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.