Automatic defect management in memory devices
US8151163B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 3, 2007 |
| Grant date | Apr 3, 2012 |
| Priority date | — |
| Expiry date | Jul 10, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/1068
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for storing data in a memory (28) that includes analog memory cells (32) includes identifying one or more defective memory cells in a group of the analog memory cells. An Error Correction Code (ECC) is selected responsively to a characteristic of the identified defective memory cells. The data is encoded using the selected ECC and the encoded data is stored in the group of the analog memory cells. In an alternative method, an identification of one or more defective memory cells among the analog memory cells is generated. Analog values are read from the analog memory cells in which the encoded data were stored, including at least one of the defective memory cells. The analog values are processed using an ECC decoding process responsively to the identification of the at least one of the defective memory cells, so as to reconstruct the data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.