Anobit Technologies Ltd.
34Patents
34Active
34Granted
58Portfolio score
Filing activity: May 10, 2007 → May 24, 2011 · 34 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7593263B2 | Memory device with reduced reading latency | Physics | 135 | Active |
| US7975192B2 | Reading memory cells using multiple thresholds | Physics | 124 | Active |
| US7697326B2 | Reducing programming error in memory devices | Electricity | 116 | Active |
| US7466575B2 | Memory device programming using combined shaping and linear spreading | Physics | 113 | Active |
| US7706182B2 | Adaptive programming of analog memory cells using statistical characteristics | Physics | 110 | Active |
| US8169825B1 | Reliable data storage in analog memory cells subjected to long retention periods | Physics | 65 | Active |
| US8000135B1 | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals | Physics | 64 | Active |
| US8156398B2 | Parameter estimation based on error correction code parity check equations | Electricity | 57 | Active |
| US7773413B2 | Reliable data storage in analog memory cells in the presence of temperature variations | Physics | 54 | Active |
| US8145984B2 | Reading memory cells using multiple thresholds | Physics | 51 | Active |
| US8156403B2 | Combined distortion estimation and error correction coding for memory devices | Physics | 50 | Active |
| US7925936B1 | Memory device with non-uniform programming levels | Physics | 50 | Active |
| US8000141B1 | Compensation for voltage drifts in analog memory cells | Physics | 38 | Active |
| US8050086B2 | Distortion estimation and cancellation in memory devices | Physics | 33 | Active |
| US7995388B1 | Data storage using modified voltages | Physics | 30 | Active |
| US8085586B2 | Wear level estimation in analog memory cells | Physics | 29 | Active |
| US7900102B2 | High-speed programming of memory devices | Physics | 28 | Active |
| US7924613B1 | Data storage in analog memory cells with protection against programming interruption | Physics | 27 | Active |
| US8060806B2 | Estimation of non-linear distortion in memory devices | Physics | 25 | Active |
| US7924587B2 | Programming of analog memory cells using a single programming pulse per state transition | Physics | 22 | Active |
| US7864573B2 | Programming analog memory cells for reduced variance after retention | Physics | 19 | Active |
| US8059457B2 | Memory device with multiple-accuracy read commands | Physics | 19 | Active |
| US8151163B2 | Automatic defect management in memory devices | Physics | 18 | Active |
| US7821826B2 | Memory cell readout using successive approximation | Physics | 18 | Active |
| US7751240B2 | Memory device with negative thresholds | Physics | 17 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.