Patent · US Active

Transition temperature microscopy

US8177422B2 · kind B2 · utility

33Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 2008
Grant dateMay 15, 2012
Priority date
Expiry dateDec 2, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01Q30/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.