Transition temperature microscopy
US8177422B2 · kind B2 · utility
33Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2008 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Dec 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q30/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.