Patent · US Active

Polishing pad composition

US8177603B2 · kind B2 · utility

36Cited by
38References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 28, 2009
Grant dateMay 15, 2012
Priority date
Expiry dateSep 25, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB29L2031/736
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

Polishing pads for use in chemical mechanical planarization (CMP) or polishing elements/surfaces of such pads are made from a combination of immiscible polymers, for example polyurethane and polyolefin. The polymers are selected on the basis of interfacial interaction, melt index and ratios of melt indices between the polymer phases—a matrix phase and a dispersed phase. By selecting the polymer system such that the two polymers are immiscible in one another and preferentially form separate domains, the dispersed phase can be removed when conditioning or polishing processes expose it. The melt index of individual polymers and the ratio of melt indices determines dispersability of a smaller phase into the matrix, hence the phase size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.