Capacitor test method and circuit therefor
US8179156B2 · kind B2 · utility
5Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2009 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Oct 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment, a closed loop control system is caused to operate in an open loop configuration. At some time while operating in the open loop configuration the system detected the presence or absence of a.c. signals in an output signal of the system in order to detect the presence or absence of a failure of a control loop element, such as an output capacitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.