SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
🏢 View company profile →3,563Patents
3,266Active
3,563Granted
64Portfolio score
Filing activity: Sep 2, 1994 → Apr 9, 2025 · 517 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10026605B2 | Method of reducing residual contamination in singulated semiconductor die | Electricity | 197 | Active |
| US6377112B1 | Circuit and method for PMOS device N-well bias control | Electricity | 175 | Expired |
| US6300679A | Flexible substrate for packaging a semiconductor component | Electricity | 163 | Expired |
| US6164523A | Electronic component and method of manufacture | Emerging Cross-Sectional Technologies | 124 | Expired |
| US6084268A | Power MOSFET device having low on-resistance and method | Electricity | 114 | Expired |
| US6204097A | Semiconductor device and method of manufacture | Electricity | 109 | Expired |
| US7298124B2 | PWM regulator with discontinuous mode and method therefor | Emerging Cross-Sectional Technologies | 103 | Expired |
| US6469484B2 | Power supply circuit and method thereof to detect demagnitization of the power supply | Electricity | 98 | Expired |
| US6933706B2 | Method and circuit for optimizing power efficiency in a DC-DC converter | Emerging Cross-Sectional Technologies | 94 | Expired |
| US7253477B2 | Semiconductor device edge termination structure | Electricity | 83 | Expired |
| US6396718B1 | Switch mode power supply using transformer flux sensing for duty cycle control | Electricity | 80 | Expired |
| US8493296B2 | Method of inspecting defect for electroluminescence display apparatus, defect inspection apparatus, and method of manufacturing electroluminescence display apparatus using defect inspection method and apparatus | Physics | 75 | Active |
| US8134358B2 | Method of auto calibrating a magnetic field sensor for drift and structure therefor | Physics | 72 | Active |
| US6570916B1 | Adaptive equalization circuit and method | Electricity | 58 | Expired |
| US7176524B2 | Semiconductor device having deep trench charge compensation regions and method | Electricity | 55 | Expired |
| US7781310B2 | Semiconductor die singulation method | Emerging Cross-Sectional Technologies | 53 | Active |
| US8012857B2 | Semiconductor die singulation method | Electricity | 53 | Active |
| US6452368B1 | Circuit and method of operating a low-noise, on-demand regulator in switched or linear mode | Electricity | 53 | Expired |
| US7989319B2 | Semiconductor die singulation method | Electricity | 53 | Active |
| US8659579B2 | Method and apparatus for detecting hold condition on an acoustic touch surface | Physics | 51 | Active |
| US7985661B2 | Semiconductor die singulation method | Emerging Cross-Sectional Technologies | 47 | Active |
| US6756771B1 | Power factor correction method with zero crossing detection and adjustable stored reference voltage | Physics | 46 | Expired |
| US9373732B2 | Image sensors with reflective optical cavity pixels | Electricity | 46 | Active |
| US7282406B2 | Method of forming an MOS transistor and structure therefor | Electricity | 45 | Expired |
| US7579632B2 | Multi-channel ESD device and method therefor | Emerging Cross-Sectional Technologies | 42 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.