Test apparatus, test method, program, and recording medium reducing the influence of variations
US8185336B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 30, 2008 |
| Grant date | May 22, 2012 |
| Priority date | — |
| Expiry date | Nov 7, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the device under test, the predicted value indicating a prescribed characteristic value of the device under test to be measured while the device under test is supplied with a test signal corresponding to the test vector; a measuring section that obtains a measured value for each test vector by measuring the prescribed characteristic value of the device under test each time the device under test is supplied with a test vector; and a judging section that judges whether the device under test is defective based on a ratio between the predicted value and the measured value corresponding to each test vector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.