Semiconductor device test system with test interface means

US8185788B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventor

• Harry Siebert · Germering, DE

Key dates

• Filing date: Jan 18, 2011
• Grant date: May 22, 2012
• Expiry date: Jan 18, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C29/48
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In a first mode of an interface, in reaction to test signals corresponding to a test standard, for example, a JTAG test standard, and received by the interface from a test device, the interface outputs signals corresponding to the test standard to a semiconductor device to be tested. In a second mode of the interface, in reaction to test signals corresponding to the test standard and received by the interface from a test device, the interface outputs signals that do not correspond to the test standard to a semiconductor device to be tested.