Determining die performance by incorporating neighboring die performance metrics
US8190391B2 · kind B2 · utility
2Cited by
12References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 29, 2007 |
| Grant date | May 29, 2012 |
| Priority date | — |
| Expiry date | Jul 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/287
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes receiving a first set of parameters associated with a plurality of die. A first die performance metric associated with a selected die is determined based on the first set of parameters. At least one neighborhood die performance metric associated with a set comprised of a plurality of die that neighbor the selected die is determined based on the first set of parameters. A second die performance metric is determined for the selected die based on the first die performance metric and the neighborhood die performance metric.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.