Microcontroller for logic built-in self test (LBIST)

US8205124B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Gary D. Grise · Colchester, US
• David E. Lackey · Jericho, US
• Steven F. Oakland · Colchester, US
• Donald L. Wheater · South Burlington, US

Key dates

• Filing date: Nov 11, 2008
• Grant date: Jun 19, 2012
• Expiry date: May 10, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31727
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Built-in self-test (BIST) microcontroller integrated circuit adapted for logic verification. Microcontroller includes a plurality of hardware description language files representing a hierarchical description of the microcontroller, the plurality of hardware description language files including a library of circuit design elements, a plurality of library design circuit elements adapted to store a uniquely defined set of input and output signals to enable a logic BIST, and a plurality of latches adapted to store a plurality of values corresponding to a behavioral profile of a test clock.