Systems and methods for inspecting an object using ultrasound
US8205500B2 · kind B2 · utility
2Cited by
13References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2008 |
| Grant date | Jun 26, 2012 |
| Priority date | — |
| Expiry date | Dec 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/011
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.