Specimen analyzing apparatus and specimen analyzing method
US8234941B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2009 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Feb 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/1086
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.