Receiver test circuits, systems and methods

US8237603B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Herbert Knapp · Munich, DE
• Erich Kolmhofer · Linz, AT

Key dates

• Filing date: Jan 29, 2010
• Grant date: Aug 7, 2012
• Expiry date: Nov 20, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S13/931
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments relate to apparatuses, systems and methods for testing high-frequency receivers. In an embodiment, a method includes integrating a pulse train generator and a receiver in an integrated circuit; generating a pulse train by the pulse train generator and applying the pulse train to an input of the receiver; measuring at least one property of the pulse train; and determining at least one characteristic of the receiver using the at least one property of the pulse train. In an embodiment, an integrated circuit includes a receiver, and a pulse train generator configured to generate a pulse train and apply the pulse train to an input of the receiver, wherein at least one characteristic of the receiver can be determined using at least one measured property of the pulse train.