Methods and apparatus for measuring 3D dimensions on 2D images
US8238642B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2008 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Jun 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the 2D pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.