Method for fast, robust, multi-dimensional pattern recognition
US8249362B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 31, 2004 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Apr 18, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/752
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurali of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.