Patent · US Active

Silicate composite polishing pad

US8257152B2 · kind B2 · utility

5Cited by
12References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 2010
Grant dateSep 4, 2012
Priority date
Expiry dateJan 29, 2031

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/24
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The invention provides a polishing pad useful for polishing at least one of semiconductor, magnetic and optical substrates. It includes a polymeric matrix having a polishing surface. Polymeric microelements are distributed within the polymeric matrix and at the polishing surface of the polymeric matrix. Silicate-containing regions distributed within each of the polymeric microelements coat less than 50 percent of the outer surface of the polymeric microelements. Less than 0.1 weight percent total of the polymeric microelements are associated with i) silicate particles having a particle size of greater than 5 μm; ii) silicate-containing regions covering greater than 50 percent of the outer surface of the polymeric microelements; and iii) polymeric microelements agglomerated with silicate particles to an average cluster size of greater than 120 μm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.