Patent · US Active

Disturb-free static random access memory cell

US8259510B2 · kind B2 · utility

2Cited by
4References
16Claims
0Family size

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Key dates

Filing dateMay 3, 2010
Grant dateSep 4, 2012
Priority date
Expiry dateMay 21, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/412
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A disturb-free static random access memory cell includes: a latch circuit having a first access terminal and a second access terminal; a first switching circuit having a first bit transferring terminal coupled to the first access terminal, a first control terminal coupled to a first write word line, and a second bit transferring terminal; a second switching circuit having a third bit transferring terminal coupled to the second access terminal, a second control terminal coupled to a second write word line, and a fourth bit transferring terminal coupled to the second bit transferring terminal; a third switching circuit having a fifth bit transferring terminal coupled to the fourth bit transferring terminal, a third control terminal coupled to a word line, and a sixth bit transferring terminal coupled to a bit line; and a sensing amplifier coupled to the bit line, for determining a bit value appearing at the bit line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.