Patent · US Active

Plasma processing apparatus and method

US8262848B2 · kind B2 · utility

0Cited by
9References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 2010
Grant dateSep 11, 2012
Priority date
Expiry dateNov 22, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3266
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes a worktable in a process chamber to horizontally place a target substrate thereon. A plasma generation space is defined above and around the worktable within the process chamber. The plasma generation space includes a peripheral plasma region and a main plasma region respectively located outside and inside an outer edge of the target substrate placed on the worktable. The apparatus further includes a magnetic field forming mechanism configured to form a magnetic field within the peripheral plasma region. The magnetic field includes magnetic force lines extending through the peripheral plasma region between a start position and an end position, at least one of which is located radially inside a sidewall of the process chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.