Patent · US Active

Test mode soft reset circuitry and methods

US8266485B2 · kind B2 · utility

1Cited by

1References

20Claims

0Family size

Assignee

Sandisk Technologies, Inc. · US

Inventors

Baojing Liu · San Jose, US
Matt Davidson · Mountain View, US
Vladimir Kovalev · Fremont, US

Key dates

Filing date	Jun 13, 2011
Grant date	Sep 11, 2012
Priority date	—
Expiry date	Jun 13, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318555
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.