System and method for eddy current inspection of parts with complex geometries
US8269489B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2008 |
| Grant date | Sep 18, 2012 |
| Priority date | — |
| Expiry date | Jul 7, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9013
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.