Method of analysis of samples by determination of a function of specific brightness
US8269965B2 · kind B2 · utility
3Cited by
3References
10Claims
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Key dates
| Filing date | May 5, 2010 |
| Grant date | Sep 18, 2012 |
| Priority date | — |
| Expiry date | Sep 4, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.