Patent · US Active

Write and erase scheme for resistive memory device

US8274812B2 · kind B2 · utility

60Cited by
4References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 14, 2010
Grant dateSep 25, 2012
Priority date
Expiry dateJan 3, 2031

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49004
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for programming a two terminal resistive memory device, the method includes applying a bias voltage to a first electrode of a resistive memory cell of the device; measuring a current flowing through the cell; and stopping the applying of the bias voltage if the measured current is equal to or greater than a predetermined value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.