Patent · US Active

Polishing pad and polishing device

US8277290B2 · kind B2 · utility

4Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 2009
Grant dateOct 2, 2012
Priority date
Expiry dateDec 25, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/22
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad used in semiconductor polishing process is provided in the present invention and a pressure sensitive adhesive is used to couple the polishing pad. The polishing pad includes a substrate, and the substrate includes a polishing surface and a reverse surface corresponding to the polishing surface. The polishing pad is characterized by: a pressure sensitive adhesive formed on the reverse surface of the substrate and used to couple with a bottom layer, and the horizontal adhesion of the pressure sensitive adhesive is higher than the vertical adhesion of the pressure sensitive adhesive.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.