Device and method for testing a circuit
US8286040B2 · kind B2 · utility
3Cited by
10References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2007 |
| Grant date | Oct 9, 2012 |
| Priority date | — |
| Expiry date | Jun 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318547
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device having testing capabilities, the device includes: a tested circuit that includes multiple scan chains; a compactor adapted to compress scan chain test responses; a mask unit, connected between the multiple scan chains and the compactor, wherein the mask unit is adapted to mask scan chain test responses outputted by the multiple scan chains during a masking period; and an mask prevention unit, adapted to prevent masking of scan chain test responses during a mask prevention period that at least partially overlaps a mask unit configuration period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.