On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

US8286042B2 · kind B2 · utility

Assignee

• TEXAS INSTRUMENTS INCORPORATED · US

Inventors

• Swathi Gangasani · Kanchinakote, IN
• Srinivasulu Alampally · Bengaluru, IN
• Divya Divakaran · Bengaluru, IN
• Rubin Ajit Parekhji · Bengaluru, IN
• Amit Kumar Dutta · Sammamish, US
• Srivaths Ravi · Plainsboro, US

Key dates

• Filing date: Feb 22, 2010
• Grant date: Oct 9, 2012
• Expiry date: Mar 10, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318385
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

This invention generates the random seed patterns using simple, low-area overhead digital circuitry on-chip. This circuit is implemented as a finite state machine whose states are the seeds as contrasted to storing the seeds in the prior art. These seeds are used to control pseudo-random pattern generation for built-in self-tests. This invention provides a large reduction in chip area in comparison with storing seeds on-chip or off-chip.