Srivaths Ravi
13Patents
7h-index
23Co-inventors
62Inventor score
Filing activity: Mar 15, 2002 → Dec 5, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7134100B2 | Method and apparatus for efficient register-transfer level (RTL) power estimation | Physics | 36 | Expired |
| US8205125B2 | Enhanced control in scan tests of integrated circuits with partitioned scan chains | Physics | 30 | Active |
| US7278123B2 | System-level test architecture for delivery of compressed tests | Physics | 29 | Expired |
| US8286042B2 | On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability | Physics | 12 | Active |
| US8671329B2 | Low overhead and timing improved architecture for performing error checking and correction for memories and buses in system-on-chips, and other circuits, systems and processes | Physics | 11 | Active |
| US8438344B2 | Low overhead and timing improved architecture for performing error checking and correction for memories and buses in system-on-chips, and other circuits, systems and processes | Physics | 9 | Active |
| US7173906B2 | Flexible crossbar switching fabric | Electricity | 8 | Expired |
| US7529669B2 | Voice-based multimodal speaker authentication using adaptive training and applications thereof | Physics | 6 | Active |
| US7260809B2 | Power estimation employing cycle-accurate functional descriptions | Physics | 4 | Expired |
| US8839063B2 | Circuits and methods for dynamic allocation of scan test resources | Physics | 2 | Active |
| US11333707B2 | Testing of integrated circuits during at-speed mode of operation | Physics | 2 | Active |
| US8856601B2 | Scan compression architecture with bypassable scan chains for low test mode power | Physics | 2 | Active |
| US8527821B2 | Hybrid test compression architecture using multiple codecs for low pin count and high compression devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.