System, computer program product and method for testing a logic circuit

US8286043B2 · kind B2 · utility

Assignee

• Freeescale Semiconductor, Inc. · US

Inventors

• Oleksandr Sakada · Munich, DE
• Florian Bogenberger · Poing, DE

Key dates

• Filing date: Feb 16, 2007
• Grant date: Oct 9, 2012
• Expiry date: Jun 17, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/3187
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for testing a logic circuit which has two or more test routine modules. Each module contains a set of instructions which is executable by (a part of) the logic circuit. The set forms a test routine for performing a self-test by the part of the logic circuit. The self-test includes the part of the logic circuit testing itself for faulty behavior, and the part of the logic circuit determining a self-test result of the testing. The system includes a test module which can execute a test application which subjects the logic circuit to a test by performing the self-test on at least a part of the logic circuit by causes the part of the logic circuit to execute a selected test routine, and determining, by the test module, an overall test result at least based on a performed self-tests. The test module includes a control output interface for activates the execution of the a selected test routine. A second test module input interface can receive the self-test result from a selected test routine. At a test module output interface the overall test result may be outputted. The test routine includes instructions for outputting, by the part of the logic circuit, data to a test routine ou…