Patent · US Active

Efuse containing sige stack

US8299570B2 · kind B2 · utility

20Cited by
10References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 22, 2011
Grant dateOct 30, 2012
Priority date
Expiry dateJul 22, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An eFuse, includes: a substrate and an insulating layer disposed on the substrate; a first layer including a single crystal or polycrystalline silicon disposed on the insulating layer; a second layer including a single crystal or polycrystalline silicon germanium disposed on the first layer, and a third layer including a silicide disposed on the second layer. The Ge has a final concentration in a range of approximately five percent to approximately twenty-five percent.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.