Patent · US Active

Probe for testing electrical properties of a test sample

US8310258B2 · kind B2 · utility

0Cited by

20References

12Claims

0Family size

Assignee

CAPRES A/S · DK

Inventors

Dirch Hjorth Petersen · Copenhagen, DK
Torben M. Hansen · Copenhagen, DK
Peter R. E. Petersen · Nørresundby, DK

Key dates

Filing date	Oct 31, 2006
Grant date	Nov 13, 2012
Priority date	—
Expiry date	Jan 10, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06716
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.