CAPRES A/S
19Patents
16Active
19Granted
43Portfolio score
Filing activity: Mar 14, 2002 → Mar 2, 2018 · 10 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7304486B2 | Nano-drive for high resolution positioning and for positioning of a multi-point probe | Physics | 13 | Expired |
| USD602885S1 | Connector for a microchip probe | General | 5 | Expired |
| US7936176B2 | Method for providing alignment of a probe | Emerging Cross-Sectional Technologies | 3 | Active |
| US8836358B2 | Automated multi-point probe manipulation | Physics | 2 | Active |
| US8907690B2 | Method of determining an electrical property of a test sample | Electricity | 2 | Active |
| US7135876B2 | Electrical feedback detection system for multi-point probes | Physics | 2 | Expired |
| US8058886B2 | Device including a contact detector | Physics | 1 | Active |
| US7852093B2 | Eliminating inline positional errors for four-point resistance measurement | Physics | 1 | Active |
| US7307436B2 | Electrical feedback detection system for multi-point probes | Physics | 1 | Active |
| USD717190S1 | Rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder | General | 0 | Active |
| USD717189S1 | Cover, connector, and handle assembly attachable to a rack for a rack-supported multi-point electrical probe holder | General | 0 | Active |
| US11215638B2 | Probe for testing an electrical property of a test sample | Electricity | 0 | Active |
| US8378697B2 | Method for providing alignment of a probe | Emerging Cross-Sectional Technologies | 0 | Active |
| US9644939B2 | Single-position hall effect measurements | Electricity | 0 | Active |
| US11131700B2 | Position correction method and a system for position correction in relation to four probe resistance measurements | Physics | 0 | Active |
| US9983231B2 | Deep-etched multipoint probe | Electricity | 0 | Active |
| US7944222B2 | Eliminating inline positional errors for four-point resistance measurement | Physics | 0 | Active |
| US8310258B2 | Probe for testing electrical properties of a test sample | Physics | 0 | Active |
| USD717188S1 | Rack for supporting a multi-point electrical probe holder | General | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.