Method for evaluating a test program quality
US8311793B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2005 |
| Grant date | Nov 13, 2012 |
| Priority date | — |
| Expiry date | May 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/33
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to a method for rating the quality of a test program for integrated circuits simulated by means of a computer. The method includes provision of a first file which describes an integrated circuit; simulation of a mutated integrated circuit which is obtained by incorporating mutations into the integrated circuit described in the first file; supplying input values to the mutated integrated circuit and recording of the output values produced for these input values by the mutated integrated circuit; comparison of the output values produced by the mutated integrated circuit with expected values which are provided by the test program, where the expected values have been generated in a reference system; and rating of the quality of the test program on the basis of the comparison results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.