Patent · US Active

Characterization with picosecond ultrasonics of metal portions of samples potentially subject to erosion

US8312772B2 · kind B2 · utility

9Cited by
3References
20Claims
0Family size

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Inventors

Key dates

Filing dateFeb 28, 2008
Grant dateNov 20, 2012
Priority date
Expiry dateJul 20, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/95638
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for evaluating a manufacturing process is described. The method includes generating an optical pump beam pulse and directing the optical pump beam pulse to a surface of a sample. A probe pulse is generated and directed the probe pulse to the surface of the sample. A probe pulse response signal is detected. A change in the probe pulse varying in response to the acoustic signal forms the probe pulse response signal. An evaluation of one or more manufacturing process steps used to create the sample is made based upon the probe pulse response signal. Additionally the method may be used for process control of a CMP process. Apparatus are also described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.