Patent · US Active

Test apparatus for measuring a characteristic of a device under test

US8319503B2 · kind B2 · utility

2Cited by

814References

23Claims

0Family size

Assignee

Cascade Microtech, Inc. · US

Inventors

Kazuki Negishi · Hillsboro, US
Mark D. Hansen · Buffalo Grove, US

Key dates

Filing date	Nov 16, 2009
Grant date	Nov 27, 2012
Priority date	—
Expiry date	Dec 30, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01R29/26
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.