Method for creating reference images in electron microscopes
US8320704B2 · kind B2 · utility
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14Claims
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Key dates
| Filing date | Sep 22, 2008 |
| Grant date | Nov 27, 2012 |
| Priority date | — |
| Expiry date | Jun 30, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/282
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods for creating reference images of fiber optic sensor plates for use in electron microscopes. The methods include taking of reference images of stripe or dot patterns. The spatial frequency of the stripe or dot patterns is such that image artifacts of the fiber optic stacks is recorded. The reference images can then be used to correct for these artifacts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.