Patent · US Active

Method for fabricating a direct wafer bonded optoelectronic device

US8334151B2 · kind B2 · utility

7Cited by
15References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 1, 2010
Grant dateDec 18, 2012
Priority date
Expiry dateNov 23, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/825
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An (Al, Ga, In)N and ZnO direct wafer bonded light emitting diode (LED), wherein light passes through electrically conductive ZnO. Flat and clean surfaces are prepared for both the (Al, Ga, In)N and ZnO wafers. A wafer bonding process is then performed between the (Al, Ga, In)N and ZnO wafers, wherein the (Al, Ga, In)N and ZnO wafers are joined together and then wafer bonded in a nitrogen ambient under uniaxial pressure at a set temperature for a set duration. After the wafer bonding process, ZnO is shaped for increasing light extraction from inside of LED.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.