Patent · US Active

System and method for testing a circuit

US8339139B2 · kind B2 · utility

5Cited by

3References

25Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Jens Barrenscheen · Munich, DE
Dirk Hammerschmidt · Villach, AT

Key dates

Filing date	Jan 29, 2010
Grant date	Dec 25, 2012
Priority date	—
Expiry date	Mar 14, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/007
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In one embodiment, a sensor for circuit testing has a first terminal and a second terminal. The first terminal is configured to be coupled to a first node of a first circuit via a first capacitor, and the second terminal is configured to be coupled to a second node of the first circuit. The sensor also has at least one transmitter and at least one receiver that measures a first transmission factor between the first terminal and the second terminal. The sensor determines that the first circuit is in a first state if the first transmission factor is above a first threshold, and determines that the first circuit is in a second state if the first transmission factor is below the first threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.