Patent · US Active

Programming of a charge retention circuit for a time measurement

US8339848B2 · kind B2 · utility

7Cited by

18References

18Claims

0Family size

Assignee

STMicroelectronics SA

Inventor

Francesco La Rosa · Gap, FR

Key dates

Filing date	Jul 20, 2007
Grant date	Dec 25, 2012
Priority date	—
Expiry date	Mar 15, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG11C27/005
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method of controlling an electronic charge retention circuit for time measurement, including at least a first capacitive element, the dielectric of which has a leakage, and at least a second capacitive element, the dielectric of which has a higher capacitance than the first, the two elements having a common electrode defining a floating node that can be connected to an element for measuring its residual charge, in which a charge retention period is programmed or initialized by injecting or extracting charges via the first element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.