Patent · US Active

Plasma processing apparatus and method of plasma distribution correction

US8343306B2 · kind B2 · utility

79Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2008
Grant dateJan 1, 2013
Priority date
Expiry dateDec 23, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32091
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus can prevent a sheath from becoming distorted, simplify a configuration of the apparatus, and prevent particles from attaching to a substrate. The plasma processing apparatus performs plasma processing on the substrate. A housing chamber houses the substrate. A mounting stage is disposed within the housing chamber and mounted with the substrate. An annular member is disposed in the mounting stage. A power supply unit supplies high-frequency power to the mounting stage. An observation unit optically observes the distribution of the plasma. A voltage applying unit applies a DC voltage to the annular member. A control unit sets the value of the DC voltage to be applied based on the observed plasma distribution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.