Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure
US8351289B1 · kind B1 · utility
12Cited by
4References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Aug 28, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A phase change memory array may include at least one cell used to determine whether the array has been altered by thermal exposure over time. The cell may be the same or different from the other cells. In some embodiments, the cell is only read in response to an event. If, in response to that reading, it is determined that the cell has changed state or resistance, it may deduce whether the change is a result of thermal exposure. Corrective measures may then be taken.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.