Analytic experimental estimator for impact of voltage-overshoot of voltage waveform on dielectric failure/breakdown
US8352900B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 24, 2012 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Jan 24, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method tests integrated circuit devices to measure a voltage overshoot condition. The method determines an overshoot time proportion. The overshoot time proportion is the amount of time the voltage overshoot condition occurs relative to the amount of time the normal operating condition occurs during a full useful operating lifetime of the integrated circuit devices. The method also determines an overshoot failure proportion. The overshoot failure proportion comprises the amount of dielectric failures that occur during the voltage overshoot condition relative to the amount of dielectric failures that occur during the normal operating condition. The method calculates an allowed overshoot voltage based on the overshoot time proportion and the overshoot failure proportion. The method additionally calculates an average overshoot voltage of a voltage waveform and compares the average overshoot voltage to the allowed overshoot voltage to identify if the average overshoot voltage exceeds the allowed overshoot voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.