Inventor · South Burlington, VT, US

Ernest Y. Wu

26Patents
3h-index
30Co-inventors
59Inventor score

Filing activity: Jan 24, 2003 → Dec 1, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US7011547B1 Connector of coaxial cables Electricity 33 Expired
US6750530B1 Semiconductor antifuse with heating element Electricity 29 Expired
US7298161B2 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability Physics 5 Expired
US10229873B2 Three plate MIM capacitor via integrity verification Electricity 2 Active
US9739824B2 Optimization of integrated circuit reliability Physics 2 Active
US8352900B1 Analytic experimental estimator for impact of voltage-overshoot of voltage waveform on dielectric failure/breakdown Physics 2 Active
US10564214B2 Optimization of integrated circuit reliability Physics 1 Active
US11257750B2 E-fuse co-processed with MIM capacitor Electricity 1 Active
US10811353B2 Sub-ground rule e-Fuse structure Electricity 1 Active
US8839180B1 Dielectric reliability assessment for advanced semiconductors Electricity 1 Active
US9287185B1 Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations Electricity 1 Active
US9026981B2 Dielectric reliability assessment for advanced semiconductors Electricity 1 Active
US11489118B2 Reliable resistive random access memory Electricity 1 Active
US10989754B2 Optimization of integrated circuit reliability Physics 1 Active
US9395403B2 Optimization of integrated circuit reliability Physics 0 Active
US10770393B2 BEOL thin film resistor Electricity 0 Active
US6891359B2 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability Physics 0 Expired
US10651083B2 Graded interconnect cap Electricity 0 Active
US10103060B2 Test structures for dielectric reliability evaluations Electricity 0 Active
US11054459B2 Optimization of integrated circuit reliability Physics 0 Active
US10804368B2 Semiconductor device having two-part spacer Electricity 0 Active
US11121082B2 Sub-ground rule e-Fuse structure Electricity 0 Active
US10262934B2 Three plate MIM capacitor via integrity verification Electricity 0 Active
US9310418B2 Correction for stress induced leakage current in dielectric reliability evaluations Physics 0 Active
US11901002B2 RRAM filament spatial localization using a laser stimulation Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.