Microcircuit testing interface having kelvin and signal contacts within a single slot
US8354854B2 · kind B2 · utility
6Cited by
4References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 2, 2008 |
| Grant date | Jan 15, 2013 |
| Priority date | — |
| Expiry date | May 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0466
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a first slot of a plurality of adjacent slots in alignment with traces on a load board of a tester, first and second conductor layers, each to make electrical contact with both a load board trace and a DUT lead. Each of the first and second contacts receives force from a resilient element extending across the slots and that urges a contact point on the contact against at least one trace and a DUT lead. Insulation between said first and second contacts in the first slot electrically insulates the first and second contacts from each other within the first slot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.