Patent · US Active

Storage circuit, integrated circuit, and scanning method

US8356217B2 · kind B2 · utility

3Cited by
7References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 25, 2010
Grant dateJan 15, 2013
Priority date—
Expiry dateOct 12, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318544
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A storage circuit, an integrated circuit and a scanning method are provided. The storage circuit includes a first storage element, and a second storage element connected to an output of the first storage element. The storage circuit includes a first setting circuit that is configured to set data of a first logic value to the first storage element when a clear signal is applied, and a second setting circuit that is configured to set data of a second logic value to the second storage element and transmit the second logic value data to a different storage circuit when a second clock signal is in an off state and the clear signal is applied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.