Hitoshi Yamanaka
5Patents
3h-index
10Co-inventors
54Inventor score
Filing activity: Dec 4, 2001 → May 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7353440B2 | Multicore processor test method | Physics | 24 | Expired |
| US7178078B2 | Testing apparatus and testing method for an integrated circuit, and integrated circuit | Physics | 19 | Expired |
| US7734973B2 | Testing apparatus and testing method for an integrated circuit, and integrated circuit | Physics | 9 | Active |
| US8356217B2 | Storage circuit, integrated circuit, and scanning method | Physics | 3 | Active |
| US11673214B2 | Lead-free solder | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.