Patent · US Active

Method of fabricating epitaxial structures

US8357574B2 · kind B2 · utility

5Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 2010
Grant dateJan 22, 2013
Priority date
Expiry dateOct 14, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0275
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an integrated device is disclosed. The disclosed method provides improved formation selectivity of epitaxial films over a pre-determined region designed for forming an epi film and a protective layer preferred not to form an epi, polycrystalline, or amorphous film thereon during an epi film formation process. In an embodiment, the improved formation selectivity is achieved by providing a nitrogen-rich protective layer to decrease the amount of growth epi, polycrystalline, or amorphous film thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.