Semiconductor substrate with interlayer connection and method for production of a semiconductor substrate with interlayer connection
US8378496B2 · kind B2 · utility
22Cited by
8References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2008 |
| Grant date | Feb 19, 2013 |
| Priority date | — |
| Expiry date | Feb 27, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/3011
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The interlayer connection of the substrate is formed by a contact-hole filling (4) of a semiconductor layer (11) and metallization (17) of a recess (16) in a reverse-side semiconductor layer (13), wherein the semiconductor layers are separated from each other by a buried insulation layer (12), at whose layer position the contact-hole filling or the metallization ends.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.