Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer
US8387443B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 11, 2009 |
| Grant date | Mar 5, 2013 |
| Priority date | — |
| Expiry date | Sep 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.