Method and system for optically inspecting parts
US8390826B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 20, 2011 |
| Grant date | Mar 5, 2013 |
| Priority date | — |
| Expiry date | Sep 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.